A novel scan chain diagnostics technique based on light emission from leakage current

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外文摘要：Scan chain diagnostics have become more important than ever due to the increasing complexity of VLSI designs， as more and more scan latches/flip-flops are utilized in designs， especially in microprocessors。 At the same time， the off-state leakage current of CMOS technology grows exponentially from one generation to the next one。 This fact imposes a big challenge on the chip design， packaging， cooling， etc。 However， innovative applications， based on the detection of light emission due to off-state leakage current (LEOSLC) have been developed for testing and diagnosing modern VLSI circuits。 We show that LEOSLC can be used to effectively debug， diagnose， and localize defects in a broken scan chain。

外文关键词：

integrated circuit designintegrated circuit testingCMOS integrated circuitsVLSIflip-flopsleakage currentsmicroprocessor chipsfault diagnosisdesign for testabilityscan chain diagnostics techniquelight emissionoffstate leakage currentVLSI designslatchesflip flopsmicroprocessorsCMOS technologychip designchip packagingchip coolingVLSI circuit testingVLSI circuit diagnosisdefect localization

作者：

P. Song、F. Stellari、T. Xia、A.J. Weger

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作者单位：

IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA

会议地点：

Charlotte, NC(US)

会议母体文献：

Test Conference, 2004. Proceedings. ITC 2004

页码：

p.140-147

出版时间：

2004

DOI：

10.1109/TEST.2004.1386946