The Effect of Cu on Ultrastructure of Wheat

扫码查看

原文链接

NETL

外文摘要：Transmission Electron Microscope (TEM) was used to investigate the damage of wheat seedlings by copper and the distribution of Cu2+ in different parts of wheat seedlings was discussed。 Experiment showed that Cu is more susceptible to migration than other metals in wheat cells。 Needle dark electron dense particles were existed in leaves cells with 5mg/L Cu stressed。 Swollen cristae in mitochondria were existed in cells with 50mg/L stressed， while mitochondria were almost disappear with 100mg/L stressed。 Chloroplast increased in wheat leaves under low concentration Cu2+ stressed while swollen chloroplast and disrupted chloroplast membrane and cascade structure damaged of chloroplast stroma were existed under high concentration。 The inference of Cu2+ on wheat root nucleolus was serious。 Disruption of nuclear membrane， multi-vesicle nucleoplasm and agglutination of nucleus chromatin were appeared at root cells under 50mg/L Cu2+ and more serious damage were appeared under 100mg/L Cu2+。

外文关键词：

Cu pollutedWheat seedlingsUltra structure

作者：

XIAO Xin、FENG Qiyan、DING Yi、MENG Qinjun、Zhang Shuang

展开 >

作者单位：

China University of Mining and Technology, Xuzhou, China

China University of Mining

会议名称：

International Symposium on Geo-Environmental Engineering for Sustainable Development

会议地点：

Xuzhou(CN)

会议母体文献：

International Symposium on Geo-Environmental Engineering for Sustainable Development; 20071022-24; Xuzhou(CN)

页码：

P.89-92

出版时间：

2007