A Test Data Compression Scheme for Adjacent Run-Length Incremental Coding
With the rapid development of integrated circuit manufacturing process,the structure of integrated circuit is be-coming more complex,and the test cost is increasingly high.Compressing test data is one of the effective methods to reduce the test cost.This paper proposes a test data compression scheme for adjacent run-length incremental coding based on dual run-length alternate coding.First,the encoding length N of the current run-length is obtained from the encoding table.Then,get the difference M of the current run minus the previous run.When M is not negative and smaller than N-1,M+1 zeros are used to represent the current run.In the process of compression,the length of the two codes is compared in real time,and the code with small length is selected,so that the data can be further compressed.The experimental results also prove that the scheme has a good compression effect.
IC testtest data compressionadjacent runrelative length
万方数据
维普
