Based on the three-dimensional piezoelectric-semiconductor (PSC) and first-order shear-deformation theories,and considering the coupling extension,flexure,and shear deformations,a buckling model for a one-dimensional functionally graded PSC extension-flexure beam was established. The stability of a functionally graded PSC extension-flexure beam under an axial load was analyzed via the finite element analysis software COMSOL,and the first three critical buckling loads and distributions of the electromechanical field for a simply supported beam were obtained. The influences of the beam length-height ratio,initial electron concentration,and functionally graded parameters on the critical buckling loads are discussed based on some numerical examples.
维普
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