摘要
为了实现共聚焦显微镜系统中的振镜线性扫描,并改善振镜噪声及系统稳定性,设计了基于FPGA的振镜扫描控制系统.该系统通过FPGA生成振镜扫描信号,输出信号幅值、频率精准,通过ARM芯片与上位机通讯,实现振镜系统的扫描控制.在扫描波形上,通过对三角波端点处进行三次样条插值处理,使振镜扫描过程中速度及加速度连续,提高振镜运行稳定性.在输出波形上通过累加器进行频率控制,提高了频率分辨率.实验表明,设计的振镜扫描控制系统波形、频率及幅值准确,成像效果清晰、细腻,并可有效降低振镜噪声.
Abstract
In order to realize the linear scanning of the galvanometer in the confocal microscope system and improve the noise of the galvanometer and the stability of the system,a galvanometer scanning control system based on FPGA is designed.The system generates the galvanometer scanning signal through FPGA,and the output signal amplitude and frequency are accurate.It communicates with the host computer through the ARM chip to realize the scanning control of the galvanometer system.On the scanning waveform,cubic spline interpolation is performed on the endpoints of the triangu-lar wave to make the speed and acceleration continuous during the scanning process of the galvanometer and improve the operational stability of the galvanometer.Frequency control is performed through the accumulator on the output waveform,and the frequency resolution is high.The galvanometer scanning control system designed in this article is compact in size,which can effectively improve the integration of the confocal microscope system and reduce costs.
基金项目
中国科学院科研仪器设备研制项目(ZDZBGCH2018003)
维普
万方数据