传感器与微系统2024,Vol.43Issue(1) :59-61.DOI:10.13873/J.1000-9787(2024)01-0059-03

共蒸发法制备金锡共晶焊料环及其性能研究

Study on preparation and properties of gold-tin eutectic solder ring by coevaporation method

李萌萌 李兆营 黄添萍
传感器与微系统2024,Vol.43Issue(1) :59-61.DOI:10.13873/J.1000-9787(2024)01-0059-03

共蒸发法制备金锡共晶焊料环及其性能研究

Study on preparation and properties of gold-tin eutectic solder ring by coevaporation method

李萌萌 1李兆营 1黄添萍1
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作者信息

  • 1. 安徽光智科技有限公司,安徽滁州 239000
  • 折叠

摘要

采用电子束共蒸发法制备了金锡共晶(Au80Sn20)焊料环,与非制冷红外探测器芯片进行气密性封装.通过SEM、AFM、X-ray、振荡测试以及测漏氦等方式验证了封装后芯片的气密性和可靠性.结果表明:键合后焊料环无明显缺陷,仅存在轻微溢料现象;经过振荡测试,溢料无脱落、无位移,且芯片密封性能可达到1 ×10-3Pa/(cm3·s),符合探测器的气密性要求.

Abstract

Electron beam coevaporation is used to prepare gold-tin eutectic(Au80 Sn20)solder rings for airtightness packaging with uncooled infrared detector chips.The airtightness and reliability of the packaged chips are verified through SEM,AFM,X-ray,vibration testing and helium leak testing.The result shows that there are no obvious defects in the solder ring after bonding,and only a slight overflow phenomenon exists.After vibration testing,the overflow material has no detachment or displacement,and the chip sealing performance can reach 1 × 10-3 Pa/(cm3·s),meeting the airtightness requirements of the detector.

关键词

非制冷红外探测器/晶圆级封装/电子束蒸发/金锡共晶焊料环/键合

Key words

uncooled infrared detector/wafer level packaging/electron beam evaporation/gold-tin eutectic solder ring/bonding

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出版年

2024
传感器与微系统
中国电子科技集团公司第四十九研究所

传感器与微系统

CSTPCD北大核心
影响因子:0.61
ISSN:1000-9787
参考文献量11
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