首页|电弧熔炼和熔铸制备工艺下真空灭弧室CuCr触头材料的电性能对比研究

电弧熔炼和熔铸制备工艺下真空灭弧室CuCr触头材料的电性能对比研究

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本研究对比了电弧熔炼和熔铸工艺制备的真空灭弧室CuCr(30)触头材料电性能.结果表明:电弧熔炼工艺制备的真空灭弧室CuCr(30)触头材料在合金组织均匀性和电寿命两个方面优于熔铸工艺制备的CuCr(30)触头材料.电弧熔炼工艺制备的CuCr(30)触头材料的显微组织相比熔铸工艺而言更加均匀、细小;电弧熔炼工艺制备的CuCr(30)触头材料的电寿命优于熔铸工艺CuCr(30)触头.触头电寿命试验是依据 JB/T 3855-2008标准进行,均安装在同规格的真空灭弧室内,试验等级是12 kV/25 kA,电弧熔炼制备的CuCr(30)和熔铸制备的CuCr(30)分别成功完成56次和38次的短路电流开断.
Comparative Study on Electrical Properties of CuCr Contact Materials in Vacuum Interrupter by Arc Melting and Melting and Casting Preparation Process
The electrical properties of CuCr(30)contact materials prepared by arc melting and casting were compared.The results show that the CuCr(30)contact material prepared by the arc melting process was superior to the CuCr(30)contact material prepared by the melting and casting process in terms of alloy microstructure uniformity and electrical life.Firstly,the microstructure of the CuCr(30)contact material prepared by the arc melting process was more uniform and fine than that of the melting and casting process.Secondly,the electrical life of CuCr(30)contact material prepared by arc melting process was also better than that of CuCr(30)contact in melting and casting process.The contact electrical life test was carried out according to JB/T 3855-2008 standard,and all installed in the vacuum arc extinguishing chamber of the same specification.Unde the test grade of 12 kV/25 kA,CuCr(30)prepared by arc melting and by melting and casting successfully completed 56 and 38 short-circuit current breaks respectively.

contact materialbreakingelectrical life test

杨晓青、李鹏、韩宁、王小军、师晓云、郭鹏

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陕西斯瑞新材料股份有限公司,陕西 西安 710077

触头材料 开断 电寿命试验

2024

电工材料
桂林电器科学研究院

电工材料

影响因子:0.378
ISSN:1671-8887
年,卷(期):2024.(6)