Precise measurement and simulation analysis of specific total loss of electrical steel sheet with first-level energy efficiency
Due to the large uncertainty in the measurement results of the National Standard Epstein method to meas-ure the specific total loss of the new-level energy efficiency low loss thin silicon steel sheet,this paper proposes a new method based on double-Epstein for measuring the specific total loss of loss thin silicon steel sheet.Using the double-Epstein method the specific total loss of the silicon steel sheet is measured,and the errors existing in the measurement method are analyzed and corrected.By processing the error-corrected experimental data the loss sepa-ration between the joint area and the uniform area of the Epstein is realized,and the mechanism of the total loss in the joint area on the measurement results of the Epstein is analyzed.The finite element simulation model of the Ep-stein is established,and study the range of the influence area of the joint and the loss of the uniform area and the joint area is studied.The simulation results are consistent with the measurement results of the double Epstein,which verifies the effectiveness and accuracy of the double-Epstein.The measurement and simulation results show that the results of measuring the specific total loss of thin silicon steel sheets by double Epstein method have higher accuracy than those measured by the Epstein method.The measurement method and error correction method pro-posed in this paper can be used for more accurate measurement of the magnetic properties of the first-class energy efficient thin silicon steel sheet.
first-level energy efficiencyelectrical steel sheetspecific total lossjoint areafinite element simu-lation
NETL
NSTL
万方数据
维普
