Testing Method for Electronic Components Based on Low Frequency Noise Measurement Technology
Aiming at the complexity of low frequency noise testing for electronic components and the limitations of traditional methods,a testing method for electronic components based on low frequency noise measurement technology is proposed. This method extracts noise signals through synchronous detection technology,and then applies adaptive filtering algorithms to reduce noise,obtaining pure low frequency noise. The experimental results show that this method can effectively capture the variation characteristics of Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) low frequency noise with gate voltage,providing a reliable tool for further studying the temperature effect of MOSFET low-frequency noise.
low frequency noiseelectronic componentsynchronous detection
万方数据
维普
