Aiming at the complexity of low frequency noise testing for electronic components and the limitations of traditional methods,a testing method for electronic components based on low frequency noise measurement technology is proposed. This method extracts noise signals through synchronous detection technology,and then applies adaptive filtering algorithms to reduce noise,obtaining pure low frequency noise. The experimental results show that this method can effectively capture the variation characteristics of Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) low frequency noise with gate voltage,providing a reliable tool for further studying the temperature effect of MOSFET low-frequency noise.
关键词
低频噪声/电子元器件/同步检波
Key words
low frequency noise/electronic component/synchronous detection
维普
万方数据