Design and Research of FT Testing of Multi-Pin Chip Based on ATE Testing Platform Chroma 3380D
This article introduces an FT test method for multi-pin chips.Based on the Chroma 3380 test system,through the analysis of the chip test requirements,a 4-site parallel test peripheral circuit is designed to realize the test of the main function and performance parameters of the chip,which can be used as a general test method for the reference of test design and development personnel.
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