Performance degradation and reliability of leakage signal conditioning circuit based on accelerated degradation test
During the service life of electronic circuits,the degradation of components will change circuit output performance,thus leading to low reliability of electronic circuits.As an electronic circuit,the reli-ability of the leakage signal conditioning circuit directly determines the reliability of the leakage circuit breaker.The signal conditioning circuit of residual current device was researched.Firstly,the key com-ponents which affect circuit performance degradation were determined based on the sensitivity analysis method,and the constant stress accelerated degradation test was carried out for the leakage signal condi-tioning circuit with temperature as accelerated stress and tripping current as degradation feature.Second-ly,according to the test data under different temperature stress,the performance degradation model of signal conditioning circuit based on Wiener process was established.The unknown parameters of degrada-tion model were obtained by using maximum likelihood estimation method,and then the probability densi-ty function and reliability function of life prediction were obtained.Finally,the predicted life of signal conditioning circuit under constant stress was derived from the Arrhenius equation.The conclusion can provide guidance for life prediction and reliability analysis of different electronic circuits.
万方数据
维普
