一种可配置的老化预测传感器设计
A configurable aging sensor design for circuit failure prediction
梁华国 1汪静 2黄正峰 1李志杰 2徐辉 2李扬2
作者信息
- 1. 合肥工业大学电子科学与应用物理学院,安徽合肥230009
- 2. 合肥工业大学计算机与信息学院,安徽合肥230009
- 折叠
摘要
随着工艺尺寸的缩减,老化导致的电路不稳定现象越来越严重.由于NBTI效应造成的老化是渐进的,因此老化是可预测的.由此提出了一种具有可配置延迟单元的老化预测电路,并将其中的稳定性校验器和锁存器的功能进行了整合.在老化的不同时期,针对老化程度,动态调节延迟单元的延迟大小,得到不同的保护带宽度,从而提高老化预测的准确率.并通过反馈电路达到对稳定性校验器的输出进行锁存的目的.与经典结构相比,电路在面积上平均节省20.6％左右,在功耗方面减少36％左右.Spice模拟器的仿真结果证实了电路的优越性.
Abstract
With the shrink of technology to scale,circuit instability caused by aging is becoming an increasingly serious problem.Circuit failure prediction is applicable for overcoming this reliability challenge.It is possible due to the gradual nature of aging degradation.In this paper,a novel integrated sensor with configurable delay element for circuit failure prediction is proposed.In order to improve the detection rate,delay of the delay element that finally forms the guard band interval can be adjusted for different degrees of severity in the aging process.Moreover,feedback circuit in the proposed design can complete latch function perfectly.The overhead is significantly small by comparing with the classical structure.It reduces the area by about 20.6％ on the average and reduces the power by about 36％.Results from the Spice simulation illustrate the superiority of this work.
关键词
失效预测/老化/可配置/整合/反馈电路Key words
failure prediction/aging/configurable/integrated/feedback circuit引用本文复制引用
基金项目
国家自然科学基金(61274036)
国家自然科学基金(61106038)
高等学校博士学科点专项科研基金(20110111120012)
出版年
2013
NETL
NSTL
维普
万方数据