首页|An Advanced Image Processing Technique for Backscatter-Electron Data by Scanning Electron Microscopy for Microscale Rock Exploration

An Advanced Image Processing Technique for Backscatter-Electron Data by Scanning Electron Microscopy for Microscale Rock Exploration

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Backscatter electron analysis from scanning electron microscopes (BSE-SEM) produces high-resolution image data of both rock samples and thin-sections, showing detailed structural and geochemical (mineralogical) information. This allows an in-depth exploration of the rock microstructures and the coupled chemical characteristics in the BSE-SEM image to be made using image processing techniques. Although image processing is a powerful tool for revealing the more subtle data "hidden" in a picture, it is not a commonly employed method in geoscientific microstructural analysis. Here, we briefly introduce the general principles of image processing, and further discuss its application in studying rock microstructures using BSE-SEM image data.

Image processingrock microstructureselectron-based imagingdata mining

Zhaoliang Hou、Kunfeng Qiu、Tong Zhou、Yiwei Cai

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Frontiers Science Center for Deep-time Digital Earth,China University of Geosciences,Beijing 100083,China

Department of Geology,University of Vienna,Vienna 1090,Austria

State Key Laboratory of Geological Processes and Mineral Resources,School of Earth Sciences and Resources,China University of Geosciences,Beijing 100083,China

National Natural Science FoundationNational Key Research and Development ProgramFrontiers Science Center for Deeptime Digital Earth111 Project of the Ministry of Science and Technologydepartment of Geology,University of Vienna

422611345352023YFE01250002652023001BP0719021FA536901

2024

10.1007/s12583-024-1969-9

地球科学学刊(英文版)
中国地质大学

地球科学学刊(英文版)

CSTPCD
影响因子：0.724
ISSN：1674-487X
年,卷(期)：2024.35(1)
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