针对液晶面板(Open/Cell,O/C)可靠度验证的需求,设计了基于图像重载模式加速O/C老化技术方案.由软件控制信号处理板的系统级芯片(System on Chip,SoC)内部图形图像产生器,创建输出O/C所需的重载模式老化图像,减少对外部信号产生器的依赖.通过图像组合、图像播放顺序、图像播放时间等实验设计重载模式老化最优化,实现O/C在整机系统集成商大量生产时进行自动化老化验证测试,提高产品的可靠度.
O/C Burn-in Technology Based on Image Overload Mode
Aiming at the requirement of Open/Cell(O/C)reliability verification,this paper designs an accelerated O/C aging technology based on image overload mode.The System-on-Chip(SoC)internal graphics image generator is controlled by the software of the signal processing board to create the overload mode burn-in image required for the output O/C,reducing the dependence on the external signal generator.Through the experiments of image combination,image play sequence and image play time,the aging optimization of heavy load mode is designed to realize the automatic aging verification test of O/C in mass production of the whole system integrator,and improve the reliability of the product.
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