伏安法测量二极管的伏安特性实验研究
Study on Voltammetry Test of Diode Volt-ampere Characteristics
咸夫正 1苏文斌 1卢红旺 1宋洪晓 1管婧 1孙尚倩1
作者信息
- 1. 山东大学 物理学院 物理国家级实验教学示范中心,山东 济南 250100
- 折叠
摘要
伏安法测量二极管的伏安特性实验兼具伏安法的运用与二极管特性的研究,实验电路简单、操作方便、原理清晰,是大中衔接人才培养的良好载体.对实验中温度与电表接法的影响进行研究与分析,旨在帮助理解实验原理,提升教学效果.指出在实验中应控制流经二极管的电流,以减小温升引入的误差.发现外接法对二极管正向伏安特性测量结果影响较小,修正后的内接法测量结果与外接法相近,实验结果得到明显改善.实验与理论对比分析表明,PN结正向偏置时的理想电流-电压关系不完全适用于实际二极管.
Abstract
The experiment in which diode volt-ampere characteristics are tested via a voltammetry method is an appropriate teaching content for students in the transition from secondary education to higher education due to its simple circuit,convenient operation and understandable principle.In this work,the influences of temperature and meter connections in the experiment are studied to help people understand the experimental principle as well as improve the teaching quality.It is suggested that the current flowing through the diode should be limited to reduce the experimental error introduced by temperature rise.The experimental error is much smaller when the ampere meter is connected outside the voltmeter-diode loop.After mathematical treatments by introducing the internal resistances of the meters,the experimental results measured when the ampere meter is connected inside the voltmeter-diode loop are similar to those when the ampere meter is connected outside the voltmeter-diode loop.The analyses of the experimental results and theoretical formula show that the ideal current-voltage relationship in positive biased PN junction is not suitable for practical diodes.
关键词
伏安法/二极管/PN结/伏安特性Key words
voltammetry/diode/PN junction/volt-ampere characteristics引用本文复制引用
出版年
2024
NETL
NSTL
万方数据