耐电压及绝缘电阻批量测试通用装置的设计
A universal fixture's design for withstand voltage and isolation resistance batch test
杨赤如 1赵晨竹 1冀兴军 1孙江超1
作者信息
- 1. 北京航天微电科技有限公司,北京 100854
- 折叠
摘要
阐述电子器件的耐电压及绝缘电阻批量测试通用装置的设计原理,并按此原理设计制作DIP 双列直插式封装的 EMI滤波器耐电压兼绝缘电阻批量测试的通用装置.在确保无漏检、无误检的前提下,大大提高测试效率,也减少测试仪器设备因反复启动、停止而造成的磨损,延缓其老化.
Abstract
The paper introduces the theory of electronic device withstand voltage and isolation resistance's universal batch test fixture,and designes a universal batch test fixture for EMI filter's withstand voltage and isolation resistance.It can improve the test efficiency and reliability of EMI filter's test greatly.In addition,the instrument and equipment's abrasion is greatly reduced because of fewer times of witch on/off during testing.
关键词
电子器件/EMI滤波器/耐电压测试/绝缘电阻测试/测试通用装置Key words
electronic device/EMI filter/withstand voltage test/isolation resistance test/universal test fixture引用本文复制引用
出版年
2024
NETL
NSTL
万方数据