Analysis of Preparation of CsPbBr3 Thin Films by Continuous Vacuum Evaporation Method and X-ray Detection Performance
This paper describes the preparation of CsPbBr3 thin films with a certain thickness using continuous evaporation method and their application in X-ray detection.Study the effect of thickness ratio of CsBr layer and PbBr2 layer on the physical properties of CsPbBr3 thin films.The results indicate that a pure cubic structured CsPbBr3 film can be obtained at a thickness ratio of 0.85,and the problem of film cracking and detachment can be effectively solved by in-situ substrate heating,while promoting the growth of film grains.There is a good linear relationship between the photocurrent and X-ray dose rate of the CsPbBr3 thin film X-ray detector prepared.The linear sensitivity of the device reaches 1 223μ CGy-1cm-2.
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