内置测试BIT设计的可靠性分析
Analysis of Reliability of Built in Test BIT Design
赵龙飞 1刘洋 1周永明1
作者信息
- 1. 北京航天发射技术研究所,北京 100076
- 折叠
摘要
阐述内置测试(BIT)系统的设计原理、可靠性分析以及性能评估方法,探讨系统在各个关键应用领域中的重要性和应用范围.通过具体案例和数据分析,展示BIT系统的性能特点和可靠性.
Abstract
This paper expounds the design principles,reliability analysis,and performance evaluation methods of built-in testing(BIT)systems,and explores the importance and application scope of the system in various key application fields.Through specific cases and data analysis,it demonstrates the performance characteristics and reliability of the BIT system.
关键词
内置测试BIT/可靠性分析/性能评估Key words
built-in testing BIT/reliability analysis/performance evaluation引用本文复制引用
出版年
2024
NETL
NSTL
万方数据