Overview of the Current Status and Development of Quality Assurance Technology for Electronic Devices
This paper describes the development history and background of reliability assurance for electronic components,as well as the current situation of electronic components in China.It explores the reliability assurance technology and existing problems in the use of electronic components,proposes response methods,including screening and testing,destructive physical analysis,failure analysis,application verification,and pseudo empty package inspection.It analyzes the development trend of component quality assurance.
NETL
NSTL
万方数据
