Analysis of Integrated Circuit Reliability Testing Method Based on High Temperature Environment
This paper expounds the reliability testing methods for integrated circuits in high-temperature environments.A reliability evaluation method based on accelerated life testing is proposed by analyzing the changes in circuit performance under different temperature conditions.By using this method,it is possible to simulate the impact of long-term high-temperature environments on integrated circuits in a relatively short period of time,thereby effectively evaluating their reliability.
integrated circuitsreliability testinghigh temperature environment
万方数据
维普
