This paper expounds the reliability testing methods for integrated circuits in high-temperature environments.A reliability evaluation method based on accelerated life testing is proposed by analyzing the changes in circuit performance under different temperature conditions.By using this method,it is possible to simulate the impact of long-term high-temperature environments on integrated circuits in a relatively short period of time,thereby effectively evaluating their reliability.
关键词
集成电路/可靠性测试/高温环境
Key words
integrated circuits/reliability testing/high temperature environment
维普
万方数据