Analysis of Special Structures in Acoustic Scanning(SAM)of Plastic Encapsulated Devices
This paper describes that acoustic scanning microscopy is the best detection method for detecting internal delamination in plastic encapsulated devices.It introduces the principle of acoustic scanning microscopy inspection and the identification method of delamination in encapsulated plastic devices.It proposes a verification method for the misjudgment problem of irregular coating layers on the surface of plastic encapsulated device chips.
万方数据
维普
