In this paper,we developed an in-situ magnetizing holder for transmission electron microscope with a strong in-plane magnetic field.By reducing the thickness of pole surface along electron beam direction,a small deflection angle of electron beam was realized when the intensity of magnetic field was increased.A clear image was obtained under a strong in-plane field.The maximum field strength was estimated to be 0.75 T by calculating the field distribution through finite element method and measuring the beam deflection angle,much higher than ever reported values.The magnetization process of AlNiCo sample with a saturation field of 0.6 T was observed by the holder inside of TEM operated at 200 kV,confirming the field strength and the good imaging condition of the developed holder.
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