Effect of conductive layer thickness of scintillator on imaging in scanning electron microscopy secondary electron detector
In situ high temperature scanning electron microscopy(SEM)imaging is a critical technique for studying high-temperature resistant materials,such as metals and ceramics.To improve the image quality of in-situ high-temperature imaging,this study examined the effect of the conductive layer thickness at the front of scintillation body,namely the aluminum film.By preparing aluminum film of different thicknesses,the blocking effect of the film on visible light and the imaging effect of scintillator were observed in the same sample region under consistent magnification and working distance.Experimental result indicate that a 120 nm-thick aluminum film coating on the scintillator is optimal for high-temperature imaging.
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