Based on the laser confocal micro-Raman spectrometer,an optical path was designed by adding a polarizer and a half wave plate to test the angle-resolved polarized(ARP)spectrum in the micro area.An electrified sample holder was designed using the Keithley 2400 source meter to obtain the micro-area electroluminescence spectrum of PeLEDs.In the experiment,black phosphorus was used to verify the functionality of the micro-area angle-resolved polarized Raman(ARPR)spectrum,and a PeLED was used to verify the mapping function of the micro-area electroluminescence spectrum.The result showed that the micro-area angle-resolved polarization Raman spectrum of black phosphorus was consistent with those in the literature,and the mapping of the micro-area electroluminescence spectrum of the PeLED was successfully obtained.This demonstrated that both newly designed functions were effective.The study provides a characterization method for further investigating the crystal orientation of two-dimensional materials and the aging mechanism of optoelectronic properties of semiconductor light-emitting devices.It can serve as a reference for other users.
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