首页|基于双目视觉的FIB-SEM双束系统图像三维重建研究

基于双目视觉的FIB-SEM双束系统图像三维重建研究

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由FIB与SEM结合而成的双束系统拥有高精度微纳加工能力的同时也具有超高空间分辨率成像功能.在微纳尺度下使用双目立体视觉进行三维重建对指导微纳材料加工等具有重要意义.本文提出了一种基于双目视觉的FIB-SEM双束系统图像三维重建方案:利用双目视觉结合图像处理技术测量出样品表面的深度信息.实验结果表明,该方法显著提高了微纳样品表面深度信息的精准度,为SEM图像三维构建提供了新的思路和方法,为FIB-SEM系统的精细加工提供了有力的保障.
Research on 3D reconstruction of FIB-SEM dual beam system image based on binocular vision
The dual beam system,combining FIB and SEM,offers high-precision micro-nano processing and ultra-high spatial resolution imaging.The application of binocular stereo vision for 3D reconstruction at the micro-nano scale is crucial for guiding the processing of micro-nano materials.This paper proposed a 3D reconstruction scheme for FIB-SEM double beam system image based on binocular vision.Depth information of the sample surface was measured using binocular vision combined with image processing technology.Experimental result demonstrated that this method significantly enhanced the accuracy of surface depth information for micro and nano samples,providing a novel approach to 3D construction of SEM images and a robust foundation for precise processing with the FIB-SEM system.

FIB-SEM dual beam system3D reconstructionbinocular stereo visiondigital image processing

端方、张海刚、孙巍、朱建鹏、王贤浩、邱婷婷、王英、杨明来

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上海应用技术大学轨道交通学院,上海 201418

卡尔蔡司(上海)管理有限公司,上海 200131

上海交大-平湖智能光电研究院,浙江嘉兴 314299

上海交通大学先进电子材料与器件平台,上海 200240

吉林农业大学信息技术学院,吉林长春 130118

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FIB-SEM双束系统 三维重建 双目立体视觉 数字图像处理

2024

电子显微学报
中国物理学会

电子显微学报

CSTPCD北大核心
影响因子:0.431
ISSN:1000-6281
年,卷(期):2024.43(6)