Traditional life prediction method uses average activation energy in the Arrhenius equation to calculate the aging rate and life span of circuit breaker.This method ignores the difference in the aging degree of each component in different aging periods,which leads to miscalculation of overall aging rate.In this regard,a segmented life prediction method was proposed based on the Arrhenius equation.Using the residual action current as the aging parameter,the whole aging process was segmented,and the aging time of each segment was calculated under different temperature and stress conditions.Using previous calculations,the average apparent activation energy was calculated for each segment.Finally,the life of each segment was accumulated to predict the whole life span.This method is more consistent with the actual leakage circuit breaker,and the predicted results are closer to its actual life span.
关键词
漏电断路器/加速老化实验/寿命预测/表观活化能
Key words
leakage circuit breakers/accelerated aging test/life prediction/activation energy
维普
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