Dielectric properties of anodic alumina films formed at different temperatures
In order to address the issue of high leakage current in aluminum electrolytic capacitors,the sparking voltage of anodized aluminum oxide films formed at room temperature (20℃) and high temperature (80℃) was compared. The leakage current and surface morphology of the films were also tested. The results show that the sparking voltage of six types of electrolytes varied between 490 V and 535 V. The leakage current of the anodized film formed at high temperature was 30％ to 62％ lower than that formed at room temperature. Scanning electron microscopy revealed that the films formed at high temperature had fewer and smaller pores compared to those formed at room temperature,resulting in lower leakage current. These findings are significant for the development of working electrolytes and the improvement of aging processes in the production of the capacitor.
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