电子元件与材料2024,Vol.43Issue(11) :1326-1333.DOI:10.14106/j.cnki.1001-2028.2024.0322

热力耦合下Cu3Sn/Cu界面力学性能的分子动力学研究

Mechanical properties of Cu3Sn/Cu interface under thermo-mechanical coupling:A molecular dynamics study

窦文涛 陈已丰 张子扬 何志伟 兰欣
电子元件与材料2024,Vol.43Issue(11) :1326-1333.DOI:10.14106/j.cnki.1001-2028.2024.0322

热力耦合下Cu3Sn/Cu界面力学性能的分子动力学研究

Mechanical properties of Cu3Sn/Cu interface under thermo-mechanical coupling:A molecular dynamics study

窦文涛 1陈已丰 2张子扬 2何志伟 2兰欣2
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作者信息

  • 1. 西安电子科技大学微电子学院,陕西西安 710018;山东天岳先进科技股份有限公司,山东济南 250102
  • 2. 山东大学能源与动力工程学院,山东济南 250102
  • 折叠

摘要

Cu3Sn/Cu界面是焊点的重要组成部分,界面附近聚集的柯肯达尔空洞在拉伸载荷作用下很可能产生微裂纹,进而引发焊点断裂失效.通过分子动力学方法研究了热力耦合场作用下应变率和温度对Cu3Sn/Cu界面力学性能的影响.研究结果表明:应变率较低时,Cu3Sn/Cu界面的塑性变形更明显,高应变率范围内则是以弹性变形为主,拉伸过程中无明显的屈服点.在300~450 K温度下,等效弹性模量、屈服强度和拉伸强度极限均随应变率的增大而增大.温度较高时,Cu3Sn/Cu界面表现为塑性变形,而在较低温度下,材料更可能表现为弹性变形.在0.0005~0.05 ps-1应变率范围内,等效弹性模量、屈服强度和拉伸强度极限均随温度的升高近似线性减小.

Abstract

The Cu3Sn/Cu interface is an important component of the solder joints.The Kirkendall voids gathered near the interface are likely to generate microcracks under tensile loading,leading to the failure of the solder joints.The effects of the strain rate and temperature on the mechanical properties of the Cu3Sn/Cu interface under thermodynamic coupling field were investigated by molecular dynamics.The results show that the plastic deformation of the Cu3Sn/Cu interface is obvious when the strain rate is low.The elastic deformation dominates in the high strain rate range,and there is no obvious yield point in the tensile process.The equivalent modulus of elasticity,yield strength,and tensile strength all increase with the strain rate at temperatures from 300 to 450 K.The Cu3Sn/Cu interface exhibits plastic deformation at high temperatures,and more likely exhibits elastic deformation at low temperatures.The equivalent modulus of elasticity,yield strength and tensile strength all decrease approximately linearly with increasing temperature at the strain rates from 0.0005 to 0.05 ps-1.

关键词

Cu3Sn/Cu界面/分子动力学/力学性能/温度/应变率

Key words

Cu3Sn/Cu interface/molecular dynamics/mechanical properties/temperature/strain rate

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出版年

2024
电子元件与材料
中国电子学会 中国电子元件行业协会 国营第715厂(成都宏明电子股份有限公司)

电子元件与材料

CSTPCD北大核心
影响因子:0.491
ISSN:1001-2028
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