电子元件与材料2024,Vol.43Issue(11) :1345-1351,1360.DOI:10.14106/j.cnki.1001-2028.2024.0239

温度循环下双面塑封BGA焊点可靠性分析

Reliability analysis of dual-side molding BGA solder joints under temperature cycling

翟茂欣 倪屹 时广轶 余未
电子元件与材料2024,Vol.43Issue(11) :1345-1351,1360.DOI:10.14106/j.cnki.1001-2028.2024.0239

温度循环下双面塑封BGA焊点可靠性分析

Reliability analysis of dual-side molding BGA solder joints under temperature cycling

翟茂欣 1倪屹 1时广轶 2余未1
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作者信息

  • 1. 江南大学集成电路学院,江苏江阴 214401
  • 2. 无锡北微传感科技有限公司,江苏无锡 214072
  • 折叠

摘要

为提高双面塑封BGA焊点的热可靠性,利用有限元分析法和Darveaux疲劳寿命模型分析了温度循环载荷下BGA焊点的应力应变分布及疲劳寿命.基于田口试验研究了上层、下层塑封料的高度及热膨胀系数对BGA焊点可靠性的影响,对焊点疲劳寿命进行初步优化,最后针对不同的下层塑封料尺寸对焊点热疲劳寿命的影响做了进一步的研究及优化.结果表明,上下层塑封料的高度和热膨胀系数越小,焊点的疲劳寿命越高,而下层塑封料对BGA焊点的覆盖不利于焊点的热可靠性.经两次优化后焊点的疲劳寿命为177次循环,是优化前的5.71倍.

Abstract

To improve the thermal reliability of BGA solder joints with dual-side molding,the stress-strain distribution and fatigue life of BGA solder joints were analyzed under temperature cyclic loading by finite element analysis and the Darveaux fatigue life model.Based on Taguchi experiments,the effect of the height and thermal expansion coefficient of the upper and lower layers of molding compound was studied on the reliability of the BGA solder joints,and the fatigue life was further optimized for the solder joints.Finally,the effect of the size of the lower layers of the molding compound was further studied and optimized on the thermal fatigue life of the solder joints.The results show that the smaller the height and thermal expansion coefficient of the upper and lower layers of the molding compound,the higher the fatigue life of the solder joints.The coverage of the BGA solder joints by the lower layer of the molding compound is not conducive to the thermal reliability of the solder joints.After two optimization steps,the fatigue life of the solder joints is 177 cycles,which is 5.71 times that before optimization.

关键词

双面塑封/温度循环/有限元分析/疲劳寿命/田口试验

Key words

dual-side molding/temperature cycle/finite element analysis/fatigue life/Taguchi experiment

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出版年

2024
电子元件与材料
中国电子学会 中国电子元件行业协会 国营第715厂(成都宏明电子股份有限公司)

电子元件与材料

CSTPCD北大核心
影响因子:0.491
ISSN:1001-2028
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