Study of High and Low Temperature Test Solutions for DC-DC Converters
High and low temperature test is one of the most important links in the screening process of DC-DC con-verter,which is directly related to the determination of the circuit.The traditional DC-DC converters test scheme for high and low temperature testing results in large variations in case temperature,which affects the stability of the test.In response to the problems of the traditional test scheme,a scheme for high and low temperature testing based on ATE and heat flow hood is proposed,and the physical structure design,material selection focus,board layout and other key points are introduced.Through the comparison of the test effect before and after the scheme optimization,it shows the improvement of the test capability of the new scheme,which can provide reference for the test screening and the design of application verification scheme of DC-DC converters.
DC-DC converterhigh and low temperatureintegrated circuittest
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