DC-DC转换器高低温测试方案研究
Study of High and Low Temperature Test Solutions for DC-DC Converters
潘宇 1杜元勋 1王建超1
作者信息
- 1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214072
- 折叠
摘要
高低温测试是DC-DC转换器筛选过程中的重要环节之一,直接关系到对电路的判定.以传统DC-DC转换器测试方案来进行高低温测试,壳温变化较大,影响测试的稳定性.针对传统测试方案存在的问题,提出了一种基于ATE、热流罩的高低温测试方案,介绍了物理结构设计、选材侧重点和板卡布局等要点.通过对方案优化前后的测试效果进行对比,展现新方案测试能力的提升,可以为DC-DC转换器的测试筛选和应用验证方案设计提供参考.
Abstract
High and low temperature test is one of the most important links in the screening process of DC-DC con-verter,which is directly related to the determination of the circuit.The traditional DC-DC converters test scheme for high and low temperature testing results in large variations in case temperature,which affects the stability of the test.In response to the problems of the traditional test scheme,a scheme for high and low temperature testing based on ATE and heat flow hood is proposed,and the physical structure design,material selection focus,board layout and other key points are introduced.Through the comparison of the test effect before and after the scheme optimization,it shows the improvement of the test capability of the new scheme,which can provide reference for the test screening and the design of application verification scheme of DC-DC converters.
关键词
DC-DC转换器/高低温/集成电路/测试Key words
DC-DC converter/high and low temperature/integrated circuit/test引用本文复制引用
出版年
2024
NETL
NSTL
万方数据