Research on Batch Testing Methods for Programmable Delay Devices
Aiming at several drawbacks of the laboratory testing methods for electrical parameters of programmable delay devices when applied to batch testing,a method combining ATE level testing and board level testing is pro-posed.Taking LTC6994 programmable delay devices as an example,the testing plan for long delay parameters is optimized.The optimized testing plan reduces the testing time by 55％compared to before optimization,the V93000 testing system occupies 1/6 of the original time,and the overall testing efficiency has doubled,which proves that this parameter optimization method can significantly improve the batch testing efficiency of programmable delay device electrical parameters.
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维普
