Research on the Design of A New Type of Burn-in Signal Driving Board
In the burn- in test, there are a large number of various types of chips. One or multiple control signals are needed in the test process. These control signals have simple waveforms and the frequency is basically within 25 MHz. However, due to the characteristics of batch of the burn- in test, the existing equipment is difficult to meet the needs of signal source driving capacity and output channel number. At present, the common signal source on the market usually has only two channels of output, and the driving capacity of each output signal cannot guarantee the batch work demand of the circuit in burn- in test, and the signal quality and amplitude attenuation are serious. To solve the above problems, a kind of signal generator is introduced, which can be multi- channel parallel, has certain driving a-bility, and can adjust the signal duty ratio and amplitude appropriately according to the actual demand of burn- in test.
burn- in testdriving capabilitymulti- channel parallelsignal generation device
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