Domestic semiconductor devices are increasingly widely used in electronic products,but compared with imported devices,there is still a certain gap in quality and reliability. The reliability level of semiconductor devices can be identified by conducting functional performance testing,structural analysis,environmental adaptability and design reliability assessment. The typical problems of semiconductor devices in testing are studied,and the corresponding improvement measures are put forward,which helps to understand the weak links of domestic components,and pro-vides directions for improving the overall quality and reliability of domestic components.
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