Requirements for Low Voltage Surge Test due to Hot Swap of Portable Computers
Hot swap technology brings significant convenience to users by simplifying operational procedures.How-ever,the low-voltage surge phenomenon occurring at the charging port during hot swap poses a significant potential risk,which may lead to equipment damage and subsequently cause property losses for users.To assess such risks and mitigate the potential hazards associated with low-voltage surges induced by hot swap,a set of test require-ments and classification standards for the low-voltage surge immunity of input/output ports on portable computers under hot swap conditions are proposed.Additionally,the corresponding test methods,test procedures,and evalu-ation system for test results are elaborated in detail so as to provide a reference for similar tests.
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