Applications of Focused Ion Beam-Scanning Electron Microscope in Research of Lithium-Ion Battery
扫码查看
点击上方二维码区域，可以放大扫码查看
原文链接
维普
万方数据
锂离子电池技术作为新能源储存领域重要的电池技术,具有广阔的发展前景.近年来,电极材料的开发和制备工艺的优化成为了锂离子电池技术的研究重点.双束电子显微镜又称聚焦离子束-扫描电子显微镜(focused ion beam-scanning electron microscope,FIB-SEM),是一种兼具微纳加工和显微成像功能的显微分析仪器,具有精确定点加工、高分辨扫描成像、适用多种类样品等优点,可为锂离子电池材料表征提供重要的技术支撑.对锂离子电池材料研究中FIB-SEM的应用场景进行了总结,归纳了FIB-SEM和其他仪器联用可实现的拓展功能.最后,对FIB-SEM在锂离子电池材料研究中的潜在应用进行了展望.
As an important battery technology in the field of new energy storage,lithium-ion battery has a broad development prospect.In recent years,the development of battery materials and the optimization of the preparation processes have been the focus of lithium-ion battery technology research.Focused ion beam-scanning electron microscope(FIB-SEM)is a microanalysis instrument with both micromachining and imaging capabilities.It has the advantages of precision machining at micro/nano-meter scale,high-resolution imaging,and applicability to a wide range of samples,which can provide important technical support for material characterization of lithium-ion batteries.The various application statuses of FIB-SEM in the research of lithium-ion battery materials were summarized in detail,and the expanded functions of FIB-SEM combined with other instruments were also introduced.Finally,the development of FIB-SEM in the research of lithium-ion batteries was prospected.
focused ion beamscanning electron microscopeinstruments combinationlithium-ion batteryfailure analysis
维普
万方数据
