Troubleshooting and routine maintenance of Hitachi S-3400N scanning electron microscope
Scanning electron microscope(SEM)is a large precision instrument for the analysis of microscopic morphology.It is widely used in the teaching and research work of our school.In order to ensure the efficient operation of SEM and prolong its service life,the management personnel must do a good job in the daily maintenance and troubleshooting of the instrument.Taking S-3400N scanning electron microscope as an example,the common faults and treatment methods of this type of scanning electron microscope are introduced,and the specific methods of daily maintenance are expounded in order to provide reference and help for the managers of the same type of instruments.
Scanning electron microscopeMaintenanceTroubleshooting
NETL
NSTL
万方数据
维普
