Improved Multi-particle Monte Carlo Method for Calculating Multipactor Threshold of Space-borne Microwave Components
The multipactor effect is one of the bottleneck problems that seriously affect the performance and safety of satellite-borne microwave components. Evaluating the multipactor risk of space-borne microwave components in the de-sign phase is an effective means to reduce repeated design and avoid long-term ground tests. In order to solve the precision problem of the existing Monte Carlo method that the multipactor process is represented by a single electron or a very small number of electrons in the initial phase, and only one electron is emitted after each collision, an effective mul-ti-particle and multi-collision Monte Carlo method is proposed. Considering the random nature of initial electrons, the initial energies, angles and phases are randomized in the method, and multiple initial electrons with statistical effects par-ticipate in the multipactor initial phase. Meanwhile, the trajectories of the electrons in the microwave component are computed with the fourth-order Runge-Kutta method, and the secondary electron emission processes are described with the Furman model. After the electrons collide with the surface of the microwave component, secondary electrons satisfy-ing the statistical rules of Furman model are emitted, and all newly generated secondary electrons will participate in the multipactor process after the collision. This kind of multi-particle and multi-collision process can more objectively and accurately characterize the physical process of multipactor effect. As an example, the multipactor in two parallel plates transmission line and coaxial transmission line is investigated with the proposed method, the existing Monte Carlo meth-od, and particle-in-cell (PIC) method separately. The results show that ,with the results of PIC method of commercial CST software as a reference, the proposed method is more accurate than the existing Monte Carlo method, and at the same time, the calculation efficiency is better than that of the PIC method of CST.
multipactorsecondary electron emissionMonte Carlo methodthresholdmicrowave component
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维普
