首页|Ultra-low dark count InGaAs/lnP single photon ava-lanche diode

Ultra-low dark count InGaAs/lnP single photon ava-lanche diode

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A low noise InGaAs/InP single photon avalanche diode(SPAD)is demonstrated.The device is based on planar type separate absorption,grading,charge and multiplication structure.Relying on reasonably designed device structure and low-damage Zn diffusion technology,excellent low-noise performance is achieved.Due to its importance,the physical mechanism of dark count is analyzed through performance characterization at different temperatures.The device can achieve 20%single photon detection efficiency and 320 Hz dark count rate(DCR)with a low after pulsing probability of 0.57%at 233 K.

LI Bin、NIU Yuxiu、FENG Yinde、CHEN Xiaomei

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Accelink Technologies Co.,Ltd.,Wuhan 430000,China

Major Scientific and Technological Innovation Projects in Hubei Province

2017AAA047

2022

光电子快报(英文版)
天津理工大学

光电子快报(英文版)

EI
影响因子:0.641
ISSN:1673-1905
年,卷(期):2022.18(11)
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