高分子学报2024,Vol.55Issue(10) :1313-1324.DOI:10.11777/j.issn1000-3304.2024.24065

基于羧酸肟酯光敏基团的非化学放大型聚合物光刻胶

Nonchemically-amplified Resists Based on Photosensitive Oxime Ester Functionalized Polystyrene

安惠雯 廉鹏 陈金平 于天君 曾毅 李嫕
高分子学报2024,Vol.55Issue(10) :1313-1324.DOI:10.11777/j.issn1000-3304.2024.24065

基于羧酸肟酯光敏基团的非化学放大型聚合物光刻胶

Nonchemically-amplified Resists Based on Photosensitive Oxime Ester Functionalized Polystyrene

安惠雯 1廉鹏 1陈金平 1于天君 2曾毅 1李嫕1
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作者信息

  • 1. 中国科学院理化技术研究所光化学转换与功能材料重点实验室 北京 100190;中国科学院大学 北京 100049
  • 2. 中国科学院理化技术研究所光化学转换与功能材料重点实验室 北京 100190
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摘要

合成了 2种羧酸肟酯光敏基团修饰的苯乙烯类单体2,2,2-三氟-1-(4'-乙烯基-[1,1'-联苯]-4-基)乙-1-酮-O-(3-甲基苯甲酰基)肟(OXE-P)和2,2,2-三氟-1-(4'-乙烯基-[1,1'-联苯]-4-基)乙烷-1-酮-O-噻吩-2-甲酰肟(OXE-S)通过核磁共振氢谱(1H-NMR)、高分辨率质谱(HRMS)表征了单体分子结构.采用可逆加成-断裂链转移(RAFT)聚合方法制备得了 2种新型聚合物POXE-P和POXE-S,使用凝胶渗透色谱(GPC)表征了聚合物分子量大小及其分布.结果表明,聚合物具有良好的溶解性、热稳定性和成膜性,满足作为光刻胶材料的要求.将聚合物分别溶于光刻胶溶剂,形成非化学放大型光刻胶.通过电子束光刻测试了 POXE-P非化学放大型光刻胶的光刻性能,结果表明,POXE-P光刻胶可获得50 nm HP(half-pitch)的光刻图案.红外光谱(FTIR)和原位产物分析研究POXE-P光刻胶的曝光机理,表明肟酯结构在曝光后发生分解,形成了羰基化合物、二氧化碳等分子.聚合物侧链的结构变化以及聚合物链间可能存在的自由基交联反应使得聚合物在曝光前后发生了溶解度转变,显影后形成负性光刻图案.

Abstract

Two styrene derivatives 2,2,2-trifluoro-1-(4'-vinyl-[1,1'-biphenyl]-4-yl)ethan-1-one-O-(3-methylbenzoyl)oxime(OXE-P)and 2,2,2-trifluoro-1-(4'-vinyl-[1,1'-biphenyl]-4-yl)ethan-1-one-O-thiophene-2-carbonyl oxime,OXE-S)modified by photosensitive oxime ester group were synthesized.They were characterized by 1H nuclear magnetic resonance(1H-NMR)spectroscopy and high-resolution mass spectrometry(HRMS).New polymers(POXE-P and POXE-S)were prepared by the reversible addition-fragmentation transfer(RAFT)polymerization,and were further characterized by gel permeation chromatography(GPC),giving molecular weights(Mw)of 8.3 kDa and 7.2 kDa,and polydispersites(Ð)of 1.1.Both polymers possess good solubility,thermal stability and film-forming capability,which meet the requirements of resist materials.The polymers were dissolved separately in the propylene glycol methyl ether acetate(PGMEA)to form nonchemically-amplified resists(n-CARs).The lithographic performance of the POXE-P resist was examined by e-beam lithography,giving a 50 nm HP(half-pitch)lithographic pattern.The mechanism of POXE-P resist during exposure was investigated by Fourier transform infrared spectrometer(FTIR)and in situ outgassing analysis.It showed that the oxime ester group decomposed during exposure to form carbonyl compounds,CO2,and other small molecules.The cleavage of side chains and the possible crosslinking led to the solubility switch of the polymer,resulting in negative lithographic patterns.

关键词

非化学放大型光刻胶/可逆加成-断裂链转移(RAFT)聚合/羧酸肟酯/电子束光刻/机理

Key words

Nonchemically-amplified resist/Reversible addition-fracture chain transfer(RAFT)polymerization/Oxime ester/Electron beam lithography/Mechanism

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基金项目

国家自然科学基金(22090012)

出版年

2024
高分子学报
中国科学院化学研究所 中国化学会

高分子学报

CSTPCDCSCD北大核心
影响因子:0.844
ISSN:1000-3304
参考文献量26
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