首页|A high-level synthesis based dual-module redundancy with multi-residue detection (DMR-MRD) fault-tolerant method for on-board processing satellite communication systems

A high-level synthesis based dual-module redundancy with multi-residue detection (DMR-MRD) fault-tolerant method for on-board processing satellite communication systems

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On board processing (OBP) satellite systems have obtained more and more attentions in recent years because of their high efficiency and performance.However,the OBP transponders are very sensitive to the high energy particles in the space radiation environments.Single event upset (SEU) is one of the major radiation effects,which influences the satellite reliability greatly.Triple modular redundancy (TMR) is a classic and efficient method to mask SEUs.However,TMR uses three identical modules and a comparison logic,the circuit size becomes unacceptable,especially in the resource limited environments such as OBP systems.Considering that,a new SEU-tolerant method based on residue code and high-level synthesis (HLS) is proposed,and the new method is applied to FIR filters,which are typical structures in the OBP systems.The simulation results show that,for an applicable HLS scheduling scheme,area reduction can be reduced by 48.26% compared to TMR,while fault missing rate is 0.15%.

single event upset (SEU)residue codetriple modular redundancy (TMR)high-level synthesis (HLS)fault missing rate

Yang Wenhui、Chen Xiang、Wang Yu、Zhao Ming、Wang Jing

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Communication Engineering of Xiamen University, Xiamen 361005, P.R.China

Aerosapce Center, Tsinghua University, Beijing 100084, P.R.China

Department of Electronic Engineering, Tsinghua University, Beijing 100084, P.R.China

Wireless and Mobile Communication Technology R&D Center, Tsinghua University, Beijing 100084, P.R.China

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Supported by the National S&T Major ProjectSupported by the National S&T Major ProjectNational Basic Research Program of China

2011ZX03003-003-012011ZX03004-0042012CB316002

2014

高技术通讯(英文版)
中国科学技术信息研究所(ISTIC)

高技术通讯(英文版)

EI
影响因子:0.058
ISSN:1006-6748
年,卷(期):2014.20(3)
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