首页|Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
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国家科技期刊平台
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A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources.It can measure loss,phase response,and dispersion properties over a broad bandwidth,with high resolution and dynamic range.
Andrew Grieco
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Qualcomm Institute,University of California San Diego,9500 Gilman Dr,La Jolla,CA 92093,USA
国家科技期刊平台
NSTL
万方数据
