首页|Ultra-fast light-field microscopy with event detection
Ultra-fast light-field microscopy with event detection
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国家科技期刊平台
NETL
NSTL
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The event detection technique has been introduced to light-field microscopy,boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.
Liheng Bian、Xuyang Chang、Hanwen Xu、Jun Zhang
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State Key Laboratory of CNS/ATM & MIIT Key Laboratory of Complex-field Intelligent Sensing,Beijing Institute of Technology,No 5 Zhongguancun South Street,Haidian District,100081 Beijing,China
国家科技期刊平台
NSTL
万方数据
