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基于腔衰荡光谱技术的半导体光放大器增益测量

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提出并验证一种基于腔衰荡光谱(CRDS)技术的半导体光放大器(SOA)增益测量方法.实验系统包括经RF信号调制的DFB激光器、半导体光放大器、环形器、光纤布拉格光栅、耦合器、温度控制器、光电探测器及示波器.导出了半导体光放大器增益与腔衰荡时间之间的函数关系式.结果表明,腔衰荡时间是半导体光放大器增益的函数,增益是波长的函数,给出了一种测量SOA增益的新方法及技术可行性.
Gain measurement of semiconductor optical amplifier by cavity ring-down spectroscopy technique
A novel method to measure the gain of semiconductor optical amplifier(SOA)by cavity ring-down spectroscopy(CRDS)technique is proposed and experimentally demonstrated.The experimental system consists of a DFB laser modulated by RF signal,a SOA,a circulator,a fiber Bragg grating,two couplers,a temperature controller,a photo detector,and an oscilloscope.The function relationship between the gain of SOA and the cavity ring-down time is derived.The results showed that the cavity ring-down time is a function of SOA gain,which is a function of wavelength.Provides a new method for measuring SOA gain and the technical feasibility.

ring-down spectroscopysemiconductor optical amplifiercavity ring-down timegain measurement

景志广、陈海燕

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长江大学 物理与光电工程学院,湖北 荆州 434023

衰荡光谱 半导体光放大器 腔衰荡时间 增益测量

2024

高师理科学刊
齐齐哈尔大学

高师理科学刊

影响因子:0.351
ISSN:1007-9831
年,卷(期):2024.44(2)
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