高师理科学刊2024,Vol.44Issue(2) :53-55.DOI:10.3969/j.issn.1007-9831.2024.02.010

基于腔衰荡光谱技术的半导体光放大器增益测量

Gain measurement of semiconductor optical amplifier by cavity ring-down spectroscopy technique

景志广 陈海燕
高师理科学刊2024,Vol.44Issue(2) :53-55.DOI:10.3969/j.issn.1007-9831.2024.02.010

基于腔衰荡光谱技术的半导体光放大器增益测量

Gain measurement of semiconductor optical amplifier by cavity ring-down spectroscopy technique

景志广 1陈海燕1
扫码查看

作者信息

  • 1. 长江大学 物理与光电工程学院,湖北 荆州 434023
  • 折叠

摘要

提出并验证一种基于腔衰荡光谱(CRDS)技术的半导体光放大器(SOA)增益测量方法.实验系统包括经RF信号调制的DFB激光器、半导体光放大器、环形器、光纤布拉格光栅、耦合器、温度控制器、光电探测器及示波器.导出了半导体光放大器增益与腔衰荡时间之间的函数关系式.结果表明,腔衰荡时间是半导体光放大器增益的函数,增益是波长的函数,给出了一种测量SOA增益的新方法及技术可行性.

Abstract

A novel method to measure the gain of semiconductor optical amplifier(SOA)by cavity ring-down spectroscopy(CRDS)technique is proposed and experimentally demonstrated.The experimental system consists of a DFB laser modulated by RF signal,a SOA,a circulator,a fiber Bragg grating,two couplers,a temperature controller,a photo detector,and an oscilloscope.The function relationship between the gain of SOA and the cavity ring-down time is derived.The results showed that the cavity ring-down time is a function of SOA gain,which is a function of wavelength.Provides a new method for measuring SOA gain and the technical feasibility.

关键词

衰荡光谱/半导体光放大器/腔衰荡时间/增益测量

Key words

ring-down spectroscopy/semiconductor optical amplifier/cavity ring-down time/gain measurement

引用本文复制引用

出版年

2024
高师理科学刊
齐齐哈尔大学

高师理科学刊

影响因子:0.351
ISSN:1007-9831
参考文献量1
段落导航相关论文