The semiconductor laser source is critical in Lidar,space detection,and optical fiber intelligent perception.Particularly,tunable semiconductor laser sources are essential for measuring wavelength/polarization-dependent loss in optical devices within the next-generation reconfigurable optical division multiplexing systems.An external cavity feed⁃back tunable semiconductor laser based on the Littman configuration offers a solution for achieving broad tuning ranges,high spectral purity,and mode-hop-free lasing output.A gain chip with a central wavelength of 1 526.276 nm and a 3 dB bandwidth of 111.005 4 nm shows significant potential as an internal cavity seed source,with different wavelengths stabi⁃lized in the oscillator via a blazed grating.Additionally,a maximum sweep speed of 200 nm/s,a minimum trigger interval of 5 pm,an intrinsic linewidth of less than 10.02 kHz,and a single longitudinal mode sweep frequency output of 130 nm without mode-hopping are demonstrated.These results highlight the excellent wide-spectrum optical properties of the In⁃GaAsP/InP gain chip and the effectiveness of the Littman feedback principle.This study advances the development of fast wavelength scanning test systems and enhances the accuracy and efficiency of device testing.
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