基于自研ASIC芯片HEPS中硅微条探测器读出电子学原型系统设计与测试
Design and Test of Readout Electronics Prototype System of Silicon Microstrip Detector Based on ASIC Chip in HEPS
杨宗信 1李航旭 2胡创业 1周杨帆 3陈一鸣 3郑波1
作者信息
- 1. 南华大学核科学与技术学院,衡阳 421001;先进核能技术设计与安全教育部重点实验室,衡阳 421001
- 2. 南华大学核科学与技术学院,衡阳 421001;中国科学院高能物理研究所,北京 100049
- 3. 中国科学院高能物理研究所,北京 100049
- 折叠
摘要
时间分辨X射线粉末衍射技术是探测物质晶体结构及其演变的重要手段.单光子计数型硅微条探测器因其灵敏度高和死时间低,在高能同步辐射光源(HEPS)的X射线粉末衍射实验中发挥着重要作用.研制适用于单光子计数型一维硅微条探测器的专用ASIC读出芯片(SSDROC)及其读出电子学系统,并采用一种新标定方法解决了SSDROC各通道对同一输入输出响应不一致的问题,该方法可显著提高各通道数据一致性并减小衍射实验数据的统计误差.探测器完成各项性能测试,结果表明整体系统线性优秀、能量分辨能力强、噪声低以及计数率高,为将来大覆盖角度一维硅微条探测器系统研制奠定坚实基础.
Abstract
Time-resolved X-ray powder diffraction technology is an important means of detecting the crystal structure and evolution of substances.Single-photon-counting silicon microstrip detectors play a crucial role in X-ray powder diffraction experiments at the High Energy Photon Source(HEPS)due to their high sensitivity and low dead time.Our team has developed an Application Specific Integrated Circuit(ASIC)readout chip called the Silicon Strip Detector Readout Circuit(SSDROC),along with its corresponding readout electronics system,specifically designed for one-dimensional single-photon-counting silicon microstrip detectors.We have also adopted a new calibration method to address the issue of inconsistent channel responses in the SSDROC when subjected to the same input.This method significantly improves the data consistency across channels and reduces the statistical error in diffraction experimental data.The detector has undergone various performance tests,and the results indicated excellent linearity,high energy resolution capability,low noise,and a high counting rate for the overall system.These findings lay a solid foundation for the future development of one-dimensional silicon microstrip detector systems with wide coverage angles.
关键词
单光子计数/硅微条探测器/ASIC芯片/读出电子学/二次阈值标定Key words
single-photon counting/silicon microstrip detector/ASIC/readout electronics/secondary threshold calibration引用本文复制引用
出版年
2024