摘要
电离总剂量效应将会导致数字集成电路电参数超差,甚至功能失效.目前数字集成电路的电离总剂量效应试验主要采用移位测试,移位测试需要一定时间将器件移动到测试机上进行测试,移动耗费的时间将导致器件有不同程度的退火,同时只有在移位测试过程中才能获得辐射效应数据,相较于在线原位测试数据量较少.数字集成电路测试系统采用PXI系统,系统内装配数字向量测试模块和电源量测模块,同时编写了测试软件和制作了测试板.通过对一款NAND Flash存储器进行在线原位辐照测试,测试结果满足对数字集成电路在X射线辐照过程中的DC、AC及功能测试要求.系统的装备应用为未来应用到各种加速器或其他辐射源的数字集成电路的在线测试奠定了基础.
Abstract
;The electrical parameters and functional of digital integrated circuits fail with the total ionizing dose effect.Digital integrated circuits mainly use not in-situ test after the radiation effect experiment.The not in-situ test requires a certain time to move the device to the IC test machine.The time consumed by the movement lead to annealing.At the same time,the radiation effect data can only be obtained during the device move to the IC test machine,which is less than the in-situ test data.[Purpose]:The digital integrated circuit test system adopts PXI system,which is assembled with digital pattern module and source measure unit.Before the digital pattern module came out in 2017,the PXI chassis mode digital integrated circuit test system did not have the ability to test the DC and AC of digital integrated circuits.At present,the system is equipped with two digital pattern modules.The single digital pattern module has 32 channels.The maximum running rate of the single channel is 100 MHz,and the accuracy of the timing edge is 39.0625 ps.The system is equipped with a source measure unit,which has a single channel power supply,and the power supply voltage range is 0～200 V.The test software interface is written by Lab VIEW,some test items and test vectors are generated by Python.For some special types of digital integrated circuits,the test software also has some special designs.when testing Flash memory,Flash will normally have one or two percent of bad blocks when it leaves the factory.We design a bad block list to automatically skip these bad blocks during testing.Some memories also require the controller to correct the wrongly written and read memories,which involves the different error correction capabilities required by different ECC algorithms.Our test software can change the error threshold because of different ECC algorithms,so as to determine whether the function of the memory is in or out of this threshold.Through the on-line in-situ irradiation test of a NAND Flash memory,the test results meet the DC,AC and functional test requirements for digital integrated circuits in the X-ray irradiation process.At the same time,considering the characteristics of small size,light weight and portability of this system,the application of digital integrated circuits in-situ test system can apply to various accelerator or other radiation sources.
维普
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