核电子学与探测技术2024,Vol.44Issue(6) :1112-1117.

134 Cs 796 keV符合修正因子与源半径和高度关系研究

Study on Relationship Between 134 Cs 796 keV Coincidence Correction Factor and Source Radius and Height

杜云武 朱杰 毕朝文 王亮 罗茂丹 毛万冲 朱小铰
核电子学与探测技术2024,Vol.44Issue(6) :1112-1117.

134 Cs 796 keV符合修正因子与源半径和高度关系研究

Study on Relationship Between 134 Cs 796 keV Coincidence Correction Factor and Source Radius and Height

杜云武 1朱杰 1毕朝文 1王亮 1罗茂丹 1毛万冲 1朱小铰1
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作者信息

  • 1. 四川省辐射环境管理监测中心站,成都 610031
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摘要

为准确测量源 134 Cs活度浓度,研究源 134 Cs特征γ射线符合修正因子与源半径和高度关系.针对其 796 keV γ射线,依据衰变纲图分解 134 Cs衰变为三个过程,采用蒙特卡罗仿真 30 种不同半径和高度源 134 Cs衰变过程,记录每个过程无符合计数和符合计数,开展源134 Cs γ能谱特征峰和符合修正分析.研究表明:134 Csγ能谱 796 keV特征峰由三个不同衰变过程决定,并且每个均有发生符合相加概率;源 134 Cs 796 keV γ射线符合修正因子与源半径和高度为二元五次多项式关系,源高度对符合修正因子影响较大,源半径对符合修正因子影响相对较小.

Abstract

In order to accurately measure the activity concentration of source 134 Cs,the relationship between the γ-ray coincidence correction factor of source 134 Cs and the radius and height of source is studied.For its 796 keV gamma rays,the decay of 134 Cs was decomposed into three processes according to the decay diagram.Monte Carlo simulation was used to simulate the decay processes of 30 kinds of 134 Cs sources with different radius and heights,record the non-coincidence count and coincidence count of each process,and carry out the characteristic peak and coincidence correction analysis of the source 134 Csγspectrum.The results show that the characteristic peak of 134 Cs γ 796 keV is determined by three different decay processes,each of which has a coincidence summing probability.The relationship between the source 134 Cs 796 keV gamma ray coincidence correction factor and the source radius and height is a binary quintic polynomial relationship,the source height has a greater influence on the coincidence correction factor,and the source radius has a relatively small influence on the coincidence correction factor.

关键词

源半径和高度/134/Cs/特征γ能峰/符合修正

Key words

source radius and height/134 Cs/characteristic γ energy peak/coincidence correction

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出版年

2024
核电子学与探测技术
中核(北京)核仪器厂

核电子学与探测技术

北大核心
影响因子:0.215
ISSN:0258-0934
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