This paper analyzes the general testing scheme for the secondary system of intelligent substations,extracts the func-tional performance supporting parameters involved in the test scheme,studies the key performance indicators of large-scale logic devices(FPGA)in the testing scheme,and proposes a feasible alternative scheme for the application of domestic FPGA in the testing systems of secondary equipment in intelligent substations.The scheme selects the mainstream large-scale logic devices of domestic manufacturers such as Unisplendour and Anlu Technology,conducting research on programmable logic resources,IP resources,lookup table resources,high-speed transceivers,EDA software,and other aspects.The research results show that au-tonomous and controllable large-scale logic devices have excellent performance in interface compatibility,big data processing ca-pability,high-speed interface support,real-time performance,and other aspects,which can support the testing requirements of intelligent substation secondary systems.At the same time,the research results also provide solid theoretical and practical sup-port for achieving complete autonomous and controllable testing of intelligent substation secondary systems.
关键词
智能变电站/二次系统测试/国产化/大规模逻辑器件
Key words
intelligent substations/secondary system test/autonomous and controllable localization/large-scale logic devices
维普
万方数据