Heat flux field measurement technique by dual-film quantum dots
Existing techniques for heat flux field measurement are mainly limited to low resolution,slow transient response,and high cost.To solve this problem,a new technique for heat flux field measurement is proposed.Quantum dots are nanoscale photoluminescent semiconductor materials whose photoluminescence spectral intensity shows a linear trend with temperature.Based on this effect,a dual-film quantum dots sample was designed and fabricated,and an experimental system for heat flux field measurement was constructed.Through calibration and measurement experiments,the study demonstrates that the average photoluminescence intensity of the quantum dots film declines linearly with increasing temperature within the tested range.The average heat flux of the bottom during the thermal evaporation of the pure water droplet in 10s under the experimental conditions was measured to be about 3.4×104W/m2.And the uncertainty of the heat flux measurement was calculated to be 0.14.The spatial resolution of this method can be up to the 30μm level,and the response time is of the second level,which realizes the high-resolution and low-delay measurement of the heat flux field on the surface.Based on the advantages of high resolution and low latency,this study holds significant potential for challenging testing environments where traditional methods fall short,such as rotating blades,high-speed aircraft,and micro-and nano-components.
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