Feasibility Study on Determination of Silicon Dioxide in Quartzite by X-Ray Fluorescence Spectrometry
With the rapid development of X-ray fluorescence spectrometry and the continuous updating of X-ray fluorescence spectrometer,the application of X-ray fluorescence spectrometry in geological experiment is more and more extensive,such as silicate,iron ore,carbonate,fluorite,etc.,have a fairly mature and reliable detection and analysis methods.However,for the quartz rocks with high silicon dioxide content,our country has not formulated relevant standards at present.On this basis,this paper sets out from the angle of composition of quartz rocks with innovative ideas,the feasibility of this method is explored by measuring the impurity composition in quartzite,normalizing it and eventually balancing the silicon dioxide content.In order to solve the problem of traditional multi-element analysis,X-ray fluorescence spectrometry is used to analyze and detect the primary and secondary elements in quartzite at one time,it provides a new direction for the analysis and detection of quartzite system.
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